Methods of eliminating pattern collapse on photoresist patterns

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United States of America Patent

PATENT NO 8956981
APP PUB NO 20140038425A1
SERIAL NO

14044304

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Abstract

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A stabilizing solution for treating photoresist patterns and methods of preventing profile abnormalities, toppling and resist footing are disclosed. The stabilizing solution comprises a non-volatile component, such as non-volatile particles or polymers, which is applied after the photoresist material has been developed. By treating the photoresist with the solution containing a non-volatile component after developing but before drying, the non-volatile component fills the space between adjacent resist patterns and remains on the substrate during drying. The non-volatile component provides structural and mechanical support for the resist to prevent deformation or collapse by liquid surface tension forces.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Daley, Jon Boise, US 32 365
Hishiro, Yoshiki Boise, US 24 199

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