Three-dimensional measurement apparatus, method for three-dimensional measurement, and computer program

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United States of America Patent

PATENT NO 8964189
APP PUB NO 20130155417A1
SERIAL NO

13817410

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Abstract

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On the basis of captured images at the time of projecting multiple-frequency slit-shaped light patterns having no overlapping edge positions onto an object, the edge portions of the slit-shaped light patterns are identified. When the edge portions overlap in the captured images of two or more slit-shaped light patterns, the reliability of the computed distance values of the positions corresponding to the edges is lowered.

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Patent Owner(s)

  • CANON KABUSHIKI KAISHA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohsawa, Hiroyuki Chiba, JP 15 451

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