Providing reliability metrics for decoding data in non-volatile storage
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United States of America Patent
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Feb 24, 2015
Grant Date -
Sep 19, 2013
app pub date -
May 6, 2013
filing date -
Mar 29, 2007
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Abstract
A set of reliability metrics is provided for use by an iterative probabilistic decoding process for non-volatile storage. A plurality of sense operations are performed on at least one set of non-volatile storage elements which are programmed to a plurality of programming states. A set of reliability metrics such as logarithmic likelihood ratios is provided based on the sense operations. The set of reliability metrics is can be used by an iterative probabilistic decoding process in determining a programming state of at least one non-volatile storage element based on at least one subsequent sense operation involving the at least one non-volatile storage element. The plurality of sense operations can be performed at different ages (e.g., number of program/erase cycles) of the at least one set of non-volatile storage elements and the set of reliability metrics can be based on an average over the different ages.
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