Three-dimensional measurement apparatus, three-dimensional measurement method and storage medium
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United States of America Patent
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Mar 3, 2015
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Dec 14, 2011
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Dec 28, 2010
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Abstract
A three-dimensional measurement apparatus comprises a light irradiation unit adapted to irradiate a measurement target with pattern light, an image capturing unit adapted to capture an image of the measurement target, and a measurement unit adapted to measure a three-dimensional shape of the measurement target from the captured image, the three-dimensional measurement apparatus further comprising: a change region extraction unit adapted to extract a change region where a change has occurred when comparing an image of the measurement target captured in advance with the captured image of the measurement target; and a light characteristic setting unit adapted to set characteristics of the pattern light from the change region, wherein the measurement unit measures the three-dimensional shape of the measurement target at the change region in a captured image after irradiation of the change region with the pattern light with the characteristics set by the light characteristic setting unit.
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