Threshold voltage calibration using reference pattern detection
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United States of America Patent
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Mar 3, 2015
Grant Date -
Nov 27, 2014
app pub date -
May 23, 2013
filing date -
May 23, 2013
priority date (Note) -
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Abstract
A memory controller identifies a predominant type of error of a memory unit of solid state memory cells. An error type differential is calculated. The error type differential is a difference between a number of charge loss errors and a number of charge gain errors of the memory unit. A VT offset error differential is calculated. The VT offset error differential is a difference between a number of errors of the predominant type at a first VT offset and a number of errors of the predominant type at a second VT offset. A VT offset is determined using a ratio of the error type differential and the VT offset error differential.
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