Apparatus and method for smart VCC trip point design for testability
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United States of America Patent
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Mar 17, 2015
Grant Date -
Feb 26, 2015
app pub date -
Aug 21, 2013
filing date -
Sep 29, 2011
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Abstract
An apparatus and method for testing is provided. An integrated circuit includes a comparison circuit that is arranged to trip based on a power supply signal reaching a trip point. The integrated circuit also includes an analog-to-digital converter that is arranged to convert the power supply signal into a digital signal. The integrated circuit also includes a storage component that stores a digital value associated with the digital signal, and provides the power supply value at an output pin of the integrated circuit. The integrated circuit includes a latch that is coupled between the analog-to-digital converter and the storage component. The latch is arranged to open when the comparison circuit trips, such that, when the comparison circuit trips, the storage component continues to store a digital value such that the digital value corresponds to the voltage associated with the power supply signal when the comparison circuit tripped.
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- SPANSION LLC
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Boon-Weng, Teoh | Penang, MY | 3 | 0 |
Ching-Kooi, Hor | Kuala Lumpur, MY | 2 | 0 |
Mee-Choo, Ong | Penang, MY | 2 | 0 |
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