Probing apparatus for semiconductor devices
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United States of America Patent
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Mar 24, 2015
Grant Date -
Jan 31, 2013
app pub date -
Nov 28, 2011
filing date -
Jul 28, 2011
priority date (Note) -
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Abstract
A probing apparatus for semiconductor devices provides a primary circuit board and a signal-adapting board positioned on the primary circuit board. The primary circuit board includes an inner area having a plurality of first contacts and an outer area having a plurality of first terminals and second terminals, and the first contacts are electrically connected to the first terminals via first conductive members in the primary circuit board. The signal-adapting board includes a plurality of second contacts electrically connected to the first contacts via second conductive members in the signal-adapting board.
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