Lifetime uniformity parameter extraction methods
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United States of America Patent
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Mar 31, 2015
Grant Date -
Sep 22, 2011
app pub date -
Mar 17, 2011
filing date -
Mar 17, 2010
priority date (Note) -
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status (Latency Note)
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Abstract
A system and method for deriving a sequence of OLED non-uniformity test patterns. A pattern generator generates a full sequence of display patterns according to a transform function, such as a discrete cosine transformation or wavelet transformation. A driver drives a display with each of the sequence of patterns. A sensor senses a property of the display, such as a total current for the display, for each of the sequence of patterns. An extraction unit derives a pixel non-uniformity model using the sensed properties and an inverse of the transform function. Patterns that contribute less than a threshold amount to the non-uniformity model can be identified and deleted to derive a sparse sequence of patterns, which can be stored in a memory. The sparse sequence of patterns can be used to test the display and extract a set of pixel non-uniformity values. The pixel non-uniformity values can be used to generate a correction signal for the display.
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