Scanning apparatus with patterned probe light
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United States of America Patent
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Apr 28, 2015
Grant Date -
Dec 25, 2014
app pub date -
Jun 20, 2014
filing date -
Jun 21, 2013
priority date (Note) -
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Abstract
A 3D scanner for recording the 3D topography of an object, the 3D scanner includes an illumination unit configured for providing probe light for illuminating the object, where the probe light includes a pattern of light rays; an image sensor for acquiring one or more 2D images of light rays returning from the illuminated object; an optical system including an optical element arranged such that the patterned probe light passes through it when propagating towards the object from the illumination unit along an optical path; and a device for changing the configuration of the optical system between a first and a second configuration, where the change in configuration comprises a change in orientation of the optical element between a first orientation and a second orientation relative to the optical path of the probe light.
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