Nonvolatile semiconductor memory device including floating gate electrodes formed between control gate electrodes and vertically formed along a semiconductor pillar

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United States of America Patent

PATENT NO 9029934
APP PUB NO 20130223149A1
SERIAL NO

13864882

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Abstract

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A nonvolatile semiconductor memory device includes: forming a stacked body by alternately stacking a plurality of interlayer insulating films and a plurality of control gate electrodes; forming a through-hole extending in a stacking direction in the stacked body; etching a portion of the interlayer insulating film facing the through-hole via the through-hole to remove the portion; forming a removed portion; forming a first insulating film on inner faces of the through-hole and the portion in which the interlayer insulating films are removed; forming a floating gate electrode in the portion in which the interlayer insulating films are removed; forming a second insulating film so as to cover a portion of the floating gate electrode facing the through-hole; and burying a semiconductor pillar in the through-hole.

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Aochi, Hideaki Kanagawa-ken, JP 245 11488
Fujiwara, Tomoko Kanagawa-ken, JP 55 1691
Fukuzumi, Yoshiaki Kanagawa-ken, JP 334 10815
Ishiduki, Megumi Kanagawa-ken, JP 106 4997
Katsumata, Ryota Kanagawa-ken, JP 205 10803
Kidoh, Masaru Tokyo, JP 143 9621
Kirisawa, Ryouhei Kanagawa-ken, JP 74 3500
Kito, Masaru Kanagawa-ken, JP 233 11022
Komori, Yosuke Kanagawa-ken, JP 89 5081
Matsunami, Junya Kanagawa-ken, JP 43 1304
Tanaka, Hiroyasu Tokyo, JP 249 10224

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