Jig for measuring EMC of semiconductor chip and method for measuring EMC of semiconductor chip using the same
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United States of America Patent
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May 19, 2015
Grant Date -
Aug 1, 2013
app pub date -
Nov 9, 2012
filing date -
Jan 27, 2012
priority date (Note) -
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status (Latency Note)
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Abstract
Disclosed are a jig for measuring EMC of a semiconductor chip and a method for measuring EMC that can accurately measure the EMC at a semiconductor chip level. The jig for measuring EMC of a semiconductor chip according to the exemplary embodiment of the present disclosure includes: a chip mount unit on which the semiconductor chip for which the EMC is to be measured is mounted; a memory unit configured to store EMC information of components in a system in which the semiconductor chip is used; and a measurement control unit configured to extract the EMC information stored in the memory unit and provide the extracted EMC information to the chip mount unit at the time of measuring the EMC of the semiconductor chip.
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