Method and system for optically inspecting outer peripheral surfaces of parts
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 2, 2015
Grant Date -
Oct 3, 2013
app pub date -
Apr 30, 2013
filing date -
May 17, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method and system for optically inspecting the entire outer peripheral surface of a part are provided. The system includes an enclosure which allows movement of a part relative to the enclosure both prior to and after inspection within the enclosure. An illumination assembly simultaneously illuminates a plurality of exterior side surfaces of the part which are annularly spaced about the axis of the part with radiation when the part is at a predetermined location within the enclosure to obtain corresponding reflected radiation signals. A plurality of lens and detector assemblies are provided. Each of the assemblies forms an optical image of one of the illuminated exterior side surfaces from the reflected radiation signals and detects the formed optical image within the enclosure. A processor processes the detected optical images to obtain a continuous, seamless, 360° panoramic composite image of the peripheral surface of the part.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully