Method for height control for single electron tunneling force spectroscopy and dynamic tunneling force microscopy

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United States of America Patent

PATENT NO 9052337
APP PUB NO 20140366228A1
SERIAL NO

14448828

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Abstract

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Height control systems and/or methods are implemented for dynamic force tunneling microscopy and single electron tunneling force spectroscopy to improve their accuracy.

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Patent Owner(s)

  • UNIVERSITY OF UTAH

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Johnson, Jon Paul Salt Lake City, US 2 9
Williams, Clayton Covey Salt Lake City, US 3 11

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