Mechanism for facilitating an optical instrumentation testing system employing multiple testing paths
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United States of America Patent
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Jun 16, 2015
Grant Date -
Apr 3, 2014
app pub date -
Sep 28, 2012
filing date -
Sep 28, 2012
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Abstract
A mechanism is described for facilitating optical testing of a device under test (DUT) using a testing mechanism having multiple testing paths according to one embodiment. A method of embodiments of the invention may include facilitating, via a loopback path, optical testing of the DUT in a loopback configuration. The loopback configuration may allow for looping between one or more transmitters and one or more receivers of the DUT. The method may further include facilitating, via a spectral path, spectral measurements relating to the DUT.
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