Measuring instrument, measurement system, measurement position positioning method and measurement position positioning program using the same
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United States of America Patent
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Jun 30, 2015
Grant Date -
Jul 3, 2014
app pub date -
Jun 7, 2012
filing date -
Jun 7, 2011
priority date (Note) -
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Abstract
A measurement system is capable of accurately aligning the corresponding measurement points of a plurality of measurement targets to evaluate the measurement targets from measurement results. A measurement system includes a measuring instrument and a PC, the measuring instrument includes a spectroscopic unit that measures a measurement point of a measurement target and a camera that images surroundings in real-time. The PC displays an evaluation image of continuous image information, which is imaged and displayed by the camera on a display screen so as to be superimposed on a reference image of still image information, which has been imaged and stored in memory. By comparing the data obtained by measuring the measurement point in the evaluation image when both images overlap each other and the measurement data of the point in the reference image, it is possible to perform positioning easily and compare the measurement data.
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