Process monitoring the processing of a material

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United States of America Patent

PATENT NO 9089926
APP PUB NO 20100134628A1
SERIAL NO

12513081

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Abstract

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A method for monitoring a processing region of a workpiece on which laser processing is being carried out, in which method the radiation emitted by the processing region is detected by a detector system in a space-resolved manner, wherein the radiation of the processing region is detected for each elemental area of the processing region imaged onto the detector system at least two wavelengths simultaneously. Accurate process monitoring may thereby be carried out.

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Patent Owner(s)

  • TRUMPF WERKZEUGMASCHINEN GMBH + CO. KG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hesse, Tim Ditzingen, DE 39 158
Magg, Winfried Ditzingen, DE 10 93
Pfitzner, Dieter Weil der Stadt, DE 9 128

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