System for defect detection and repair

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United States of America Patent

PATENT NO 9092842
APP PUB NO 20130034293A1
SERIAL NO

13197866

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Abstract

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A system for identifying a repair cut location for a defect in a liquid crystal device includes receiving an input image, a defect mask image, and a landmark structure image. The system determines a repair cut location, based upon the input image, the defect mask image, and the landmark structure image, for a liquid crystal device proximate the defect. The determination may be based upon a type of said defect, a cause of said defect, a position of said defect, and a spatial relationship of the defect and a structure of the landmark image.

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Patent Owner(s)

  • SHARP KABUSHIKI KAISHA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Xu, Xinyu Vancouver, US 45 371
Yuan, Chang Vancouver, US 58 1791

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