Throughput information generating apparatus of sample analyzer, sample analyzer, throughput information generating method of sample analyzer, and computer program product
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United States of America Patent
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Aug 4, 2015
Grant Date -
Jan 5, 2012
app pub date -
Jun 29, 2011
filing date -
Jun 30, 2010
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Abstract
An apparatus for generating throughput information of a sample analyzer is disclosed. Specifically, this apparatus generates throughput information of a sample analyzer capable of measuring a sample on a plurality of measurement items in which measurement time differs from each other. The apparatus receives an input of a plurality of measurement orders, wherein a measurement order includes a designation of at least one measurement item, generates the throughput information of the sample analyzer based on the received plurality of measurement orders; and outputs the generated throughput information.
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