Cone-shaped orifice arrangement for inductively coupled plasma sample introduction system
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United States of America Patent
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Aug 11, 2015
Grant Date -
Oct 20, 2011
app pub date -
Feb 23, 2011
filing date -
Feb 24, 2010
priority date (Note) -
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Abstract
A mass analysis system including a sample inlet arranged to introduce a sample and an ion source coupled to the sample inlet and arranged to ionize a portion of the sample into ions. The system also includes a sampler element having a sample orifice arranged to receive the sample ions into a first vacuum chamber. The system includes a skimmer element having a skimmer orifice arranged to receive the sample ions from the first vacuum chamber into a second vacuum chamber where the skimmer orifice is of a first size. The system further includes a third cone element having a third cone orifice of a second size arranged to receive the sample ions from the second vacuum chamber into a third vacuum chamber where the third cone is configured to allow a continuum flow of ions through the third cone orifice. The third chamber includes an ion optics assembly and mass analyzer.
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