Optical microscope and optical instrumentation
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United States of America Patent
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Aug 18, 2015
Grant Date -
Apr 17, 2014
app pub date -
Dec 16, 2013
filing date -
Jun 3, 2009
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Abstract
An optical microscope that can prevent an increase in the complexity of the light source system is equipped with optics readily capable of adequate operation even when the modulation frequency is increased to reduce the impact of the intensity noise of the laser. The optical microscope irradiates a sample with a first train of optical pulses having a first optical frequency, which is generated by a first light source, and a second train of optical pulses having a second optical frequency, which is temporally synchronized with the first train of optical pulses and is generated by a second light source, and detects light scattered from the sample. A first repetition frequency of the first train of optical pulses is an integral sub-multiple of a second repetition frequency of the second train of optical pulses.
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