Forming three dimensional isolation structures

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United States of America Patent

PATENT NO 9111773
APP PUB NO 20150091128A1
SERIAL NO

14567837

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Abstract

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A three dimensional shallow trench isolation structure including sets of parallel trenches extending in two perpendicular directions may be formed by depositing a conformal deposition in a first set of parallel trenches, oxidizing the second set of trenches to enable selective deposition in said second set of trenches and then conformally depositing in said second set of trenches. In some embodiments, only one wet anneal, one etch back, and one high density plasma chemical vapor deposition step may be used to fill both sets of trenches.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Carollo, Enzo Montecchio Prec., IT 7 426
Di, Piazza Luca Milan, IT 5 3
Marelli, Sara Cantu, IT 2 4
Mariani, Marcello Milan, IT 71 383

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