Surface shape measuring device

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United States of America Patent

PATENT NO 9134211
APP PUB NO 20130255396A1
SERIAL NO

13852806

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Abstract

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A surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto.

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Patent Owner(s)

  • KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cho, Young-Ho Daejeon, KR 71 469
Kim, Jae-Min Seoul, KR 29 243
Seo, Dae-Geon Daegu, KR 1 6

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