Selection of data for redundancy calculation by likely error rate

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United States of America Patent

PATENT NO 9136022
APP PUB NO 20150117099A1
SERIAL NO

14285052

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Abstract

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Layers in a multi-layer memory array are categorized according to likely error rates as predicted from their memory hole diameters. Data to be stored along a word line in a high risk layer is subject to a redundancy operation (e.g. XOR) with data to be stored along a word line in a low risk layer so that the risk of both being bad is low.

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Patent Owner(s)

  • SANDISK TECHNOLOGIES LLC

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Avila, Chris Saratoga, US 66 1462
Costa, Xiying Milpitas, US 39 1261
Dong, Yingda San Jose, US 252 4837
Dusija, Gautam A Milpitas, US 15 125
Koh, Pao-Ling Fremont, US 21 283
Mui, Man Fremont, US 40 634
Raghu, Deepak Milpitas, US 36 998

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