Methods and systems for grain size evaluation of multi-cystalline solar wafers
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United States of America Patent
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Sep 15, 2015
Grant Date -
Jun 20, 2013
app pub date -
Dec 19, 2011
filing date -
Dec 19, 2011
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Abstract
Methods and systems for evaluation of wafers are disclosed. One example method includes illuminating a multi-crystalline wafer according to a plurality of lighting parameters, capturing a plurality of images of the multi-crystalline wafer, stacking and projecting the plurality of images to generate a composite image, analyzing the composite image to identify one or more grains of the multi-crystalline wafer, and generating a report based on the analysis of the composite image. The multi-crystalline wafer is illuminated according to a different one of the plurality of lighting parameters in at least two of the plurality of images.
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