Testing a circuit assembly that contains a piezoelectric switch
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United States of America Patent
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Sep 22, 2015
Grant Date -
Oct 3, 2013
app pub date -
Mar 27, 2013
filing date -
Mar 27, 2012
priority date (Note) -
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Abstract
A method of testing a circuit assembly that includes a piezoelectric switch may include driving a DC current into the piezoelectric switch. The method may further include measuring the time interval it takes to develop a predetermined voltage across the piezoelectric switch and comparing the measured time interval with a first predetermined time interval and a second predetermined time interval. The method may include identifying the circuit assembly as defective when the measured time interval is either less than the first predetermined time interval or more than the second predetermined time interval, and otherwise identifying the circuit assembly is operational.
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