Imaging system with defocused and aperture-cropped light sources for detecting surface characteristics
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United States of America Patent
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Dec 22, 2015
Grant Date -
Aug 22, 2013
app pub date -
Aug 23, 2012
filing date -
Aug 24, 2011
priority date (Note) -
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Abstract
A system for detecting characteristics of a surface includes multiple sources of lights, a platform structure configured to support the surface, a lens aligned with the platform structure, a cropping aperture, and an image receiver. The platform structure is configured to receive light from the source of light and the lens is positioned such that the source of light is not in focus, but the detected surface is in focus. The cropping aperture is configured to crop light reflected from the surface, and the image receiver is configured to receive the light conditioned by the cropping aperture.
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