Internal plasma grid applications for semiconductor fabrication in context of ion-ion plasma processing

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United States of America Patent

PATENT NO 9230819
APP PUB NO 20140302678A1
SERIAL NO

14184491

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Abstract

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The embodiments disclosed herein pertain to improved methods and apparatus for etching a semiconductor substrate. A plasma grid assembly is positioned in a reaction chamber to divide the chamber into upper and lower sub-chambers. The plasma grid assembly may include one or more plasma grids having slots of a particular aspect ratio, which allow certain species to pass through from the upper sub-chamber to the lower sub-chamber. In some cases, an electron-ion plasma is generated in the upper sub-chamber. Electrons that make it through the grid to the lower sub-chamber are cooled as they pass through. In some cases, this results in an ion-ion plasma in the lower sub-chamber. The ion-ion plasma may be used to advantage in a variety of etching processes.

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Patent Owner(s)

  • LAM RESEARCH CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chung, Ting-Ying Fremont, US 3 235
Del, Puppo Helene Fremont, US 5 237
Gani, Nicolas Fremont, US 20 798
Kamarthy, Gowri Pleasanton, US 20 882
Kim, Do Young Albany, US 155 1642
Kimura, Yoshie Castro Valley, US 24 381
Mani, Radhika Fremont, US 6 263
Paterson, Alex San Jose, US 110 2833
Sun, Noel Yui Sunnyvale, US 2 226
Titus, Monica Sunnyvale, US 20 751
Yu, Jen-Kan Fremont, US 5 278

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