Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay

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United States of America Patent

PATENT NO 9234937
APP PUB NO 20120195590A1
SERIAL NO

13442786

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Abstract

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Techniques and devices for measuring phase noise in radio frequency (RF), microwave, or millimeter signals based on photonic delay.

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Patent Owner(s)

Patent OwnerAddress
OEWAVES INC465 N HALSTEAD STREET NO 140 PASADENA CA 91107

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Eliyahu, Danny Pasadena, US 14 561
Maleki, Lute Pasadena, US 51 1506
Seidel, David Alta Loma, US 28 709

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