Optical measurement probe, and optical measurement device provided with the same

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United States of America Patent

PATENT NO 9239298
APP PUB NO 20150085283A1
SERIAL NO

14481230

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO2. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.

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Patent Owner(s)

  • HONDA MOTOR CO., LTD.;SHIMADZU CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Azumagakito, Isao Wako, JP 16 29
Furukawa, Yasuyuki Kyoto, JP 11 67
Hiraoka, Ryoji Hirakata, JP 5 1
Iwai, Nobuyuki Kyoto, JP 75 750
Nagai, Tetsuya Nishinomiya, JP 28 273
Okada, Satoru Wako, JP 76 1827

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