Method and apparatus for analysing a material

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United States of America Patent

PATENT NO 9239302
APP PUB NO 20110288787A1
SERIAL NO

13062880

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of analyzing particles of a material which include a constituent is disclosed. The method comprises the steps of exposing particles of the material to x radiation having a range of x-radiation energies, detecting x-radiation intensities at two different energy levels transmitted through the particles, and determining the concentration of the constituent in particles from the detected intensities.

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Patent Owner(s)

  • TECHNOLOGICAL RESOURCES PTY. LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Greenwood-Smith, Robin Mt. Martha, AU 2 9
Heuer, Trevor Mindarie, AU 2 26
Pidcock, Andrea Gabrielle Melbourne, AU 2 89

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