Apparatus for analysis of sample chemical species featuring multiple sample placement locations
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United States of America Patent
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Jan 19, 2016
Grant Date -
Dec 13, 2012
app pub date -
Jun 1, 2012
filing date -
Jun 3, 2011
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Abstract
A Direct Sample Analysis (DSA) ion source system operating at essentially atmospheric pressure is configured to facilitate the ionization, or desorption and ionization, of sample species from a wide variety of gaseous, liquid, and/or solid samples, for chemical analysis by mass spectrometry or other gas phase ion detectors. The DSA system includes one or more means of ionizing samples and includes a sealed enclosure which provides protection from high voltages and hazardous vapors, and in which the local background gas environment may be monitored and well-controlled. The DSA system is configured to accommodate single or multiple samples at any one time, and provide external control of individual sample positioning, sample conditioning, sample heating, positional sensing, and temperature measurement.
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