Method and analysis system for eye examinations
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United States of America Patent
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Jan 26, 2016
Grant Date -
Oct 30, 2014
app pub date -
Apr 29, 2014
filing date -
Apr 30, 2013
priority date (Note) -
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Abstract
An ophthalmological analysis system for examining an eye, in particular in the region of a front eye section of an eye includes first and second analysis systems obtaining sectional images of the eye. The first analysis system includes a projection device and a monitoring device arranged relative to each other according to the Scheimpflug rule. The second analysis system is an optical coherence interferometer. A processing device processes a first image data set obtained by the first analysis system and a second image data set obtained by the second analysis system to supplement the first image data set, at least partially, with data of the second image data set.
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