Method and device for detecting defects in material distribution in transparent containers
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United States of America Patent
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Jan 26, 2016
Grant Date -
Jan 30, 2014
app pub date -
Feb 16, 2012
filing date -
Feb 18, 2011
priority date (Note) -
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Abstract
An inspection process for detecting defects of thin type, on transparent containers for a series of inspection points distributed over an inspection region superposed according to a determined height of the container taken according to central axis thereof, and according to the circumference of the container comprising:
- sending a light beam so as to recover on a light sensor the reflected beams by the internal and external faces of the wall of the container,measuring at each inspection point the thickness of the wall as a function of separation at the level of the light sensor between the reflected beams by the internal and external faces,processing the thickness measurements by analyzing their distribution over the inspection region to extract therefrom geometric characteristics, and comparing these geometric characteristics to reference values to determine if the container has a material distribution defect.
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