LOGIC-BUILT-IN-SELF-TEST DIAGNOSTIC METHOD FOR ROOT CAUSE IDENTIFICATION
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United States of America Patent
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Jan 26, 2016
Grant Date -
Feb 4, 2016
app pub date -
Sep 30, 2014
filing date -
Jul 30, 2014
priority date (Note) -
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Abstract
A method of performing root cause identification for a failure on an integrated circuit with a logic built-in self-test (LBIST) system and an LBIST system to perform root cause identification are described. The system includes one or more channel scan paths, each of the one or more macros associated with each of the one or more channel scan paths being executed during a test cycle, and a processor to initiate one or more of the test cycles via an LBIST controller, identify a failing test cycle among the one or more of the test cycles, identify a failing channel scan path among the one or more channel scan paths for the failing cycle, identify the one or more macros associated with the failing channel scan path, and iteratively check each of the one or more macros associated with the failing channel scan path to perform the root cause identification.
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