CMM with flaw detection system

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United States of America Patent

PATENT NO 9250214
APP PUB NO 20140260627A1
SERIAL NO

13797537

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Abstract

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A flaw detection system includes a CMM having a base and one or more transfer members, one or more articulation members connecting the one or more transfer members to the base, and a flaw detection sensor at a distal end, the CMM being configured to measure a location of the flaw detection sensor, and a processor configured to correlate the location of the flaw detection sensor as measured by the CMM with data detected by the flaw detection sensor.

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Patent Owner(s)

  • HEXAGON METROLOGY, INC.

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ferrari, Paul Carlsbad, US 64 1979
Jung, Hyun Kwon Oceanside, US 9 123
Tait, Hogar Carlsbad, US 18 710

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