Sample holder for electron microscopy for low-current, low-noise analysis

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United States of America Patent

PATENT NO 9275825
APP PUB NO 20140361194A1
SERIAL NO

14369537

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Abstract

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A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.

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Patent Owner(s)

Patent OwnerAddress
PROTOCHIPS INC617 HUTTON STREET SUITE 111 RALEIGH NC 27606

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Damiano, John Apex, US 10 110
Gardiner, Daniel S Wake Forest, US 4 39
Nackashi, David P Raleigh, US 49 487

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