Methods and systems for early stop simulated likelihood ratio test
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United States of America Patent
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Mar 8, 2016
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N/A
app pub date -
Mar 14, 2013
filing date -
Mar 14, 2013
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Abstract
A method for modeling a set of observed data comprises selecting a reference model and an alternative model as possible descriptions of the set of observed data, and storing an index function for measuring fit of models to data. The method further includes performing, by one or more processors, a simulated threshold-fitting for a first of the two models, deriving an initial simulated index for the second model for fitting the second model to the simulated data, and deriving an initial boundary for simulated index difference including calculating a difference between the threshold-fit simulated index for the first model and the initial simulated index for the second model. The method further includes determining, based on a comparison, whether to update a counter used in calculating a simulated p-value, and selecting, based on the simulated p-value, one of the reference and alternative models for modeling the set of observed data.
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