Electrically conductive pins for microcircuit tester
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United States of America Patent
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Mar 29, 2016
Issued Date -
N/A
app pub date -
May 27, 2014
filing date -
Mar 10, 2010
priority date (Note) -
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status (Latency Note)
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Abstract
The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The bottom pins has a lower contact surface which includes an arcuate portion or ridge which increases contact pressure and ablates oxides by the rocking action of ridge when the DUT in inserted.
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