Phase change memory stack with treated sidewalls

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United States of America Patent

PATENT NO 9306159
APP PUB NO 20150318468A1
SERIAL NO

14266415

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Abstract

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Memory devices and methods for fabricating memory devices have been disclosed. One such method includes forming the memory stack out of a plurality of elements. An adhesion species is formed on at least one sidewall of the memory stack wherein the adhesion species has a gradient structure that results in the adhesion species intermixing with an element of the memory stack to terminate unsatisfied atomic bonds of the element. The gradient structure further comprises a film of the adhesion species on an outer surface of the at least one sidewall. A dielectric material is implanted into the film of the adhesion species to form a sidewall liner.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chan, Tsz W Boise, US 16 172
Hu, Yongjun Jeff Boise, US 163 1139
Lengade, Swapnil Boise, US 28 178
McTeer, Everett Allen Eagle, US 25 171
Qin, Shu Boise, US 51 694

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