Apparatus and method for controlling the reliability stress rate on a processor

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United States of America Patent

PATENT NO 9317389
APP PUB NO 20150006971A1
SERIAL NO

13931115

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus and method for tracking stress on a processor and responsively controlling operating conditions. For example, one embodiment of a processor comprises: stress tracking logic to determine stress experienced by one or more portions of the processor based on current operating conditions of the one or more portions of the processor; and stress control logic to control one or more operating characteristics of the processor based on the determined stress and a target stress accumulation rate.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chu, Allen Portland, US 7 45
Rotem, Efraim Haifa, IL 195 3410
Shapira, Dorit Atlit, IL 22 93
Shulman, Nadav Tel Mond, IL 74 1089
Sistla, Krishnakanth V Beaverton, US 96 793
Zobel, Shmulik Hinanit, IL 1 5

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