Techniques for improved feature detection

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United States of America Patent

PATENT NO 9317768
APP PUB NO 20140086490A1
SERIAL NO

13625962

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Abstract

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Techniques for improved feature detection are described. In one embodiment, for example, a device may include a processor circuit and a feature detection module, and the feature detection module may be operative on the processor circuit to perform a first feature detection iteration for a graphics information element using an integral pixel value array, determine a scaling factor, recalculate the integral pixel value array based on the scaling factor, and perform a second feature detection iteration for the graphics information element using the recalculated integral pixel value array. Other embodiments are described and claimed.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Li, Qiang Beijing, CN 803 10868
Wang, Bin Beijing, CN 1026 8458
Yang, Liu Beijing, CN 157 1800

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