Saw mode-based surface defect system/method
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United States of America Patent
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May 10, 2016
Grant Date -
Oct 16, 2014
app pub date -
Mar 14, 2014
filing date -
Mar 15, 2013
priority date (Note) -
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status (Latency Note)
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Abstract
Various approaches for assessing a part for a defect are disclosed and that are based upon SAW modes. In one embodiment, a part-under-test (120) is excited. One or more SAW modes (206) are identified in the frequency response (240/260) of the part-under-test (120). A SAW mode area (248/266) in the frequency response of the part-under-test (120) is compared with a baseline SAW mode area (238/258) of a baseline frequency response (230/250) (and which may be associated with an acceptable part). This comparison may be used to determine if the part-under-test (120) may be characterized defective in at least some respect.
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