Method and apparatus for analyzing a sample of sub-micron particles
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 17, 2016
Grant Date -
Jun 5, 2014
app pub date -
Aug 6, 2012
filing date -
Aug 5, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The present invention provides a method of analyzing a sample comprising sub-micron particles, comprising determining first information about the size of particles and number of particles in the sample by nanoparticle tracking analysis; determining second information about average particle size of particles in the sample by dynamic light scattering; determining from the first information third information representing the theoretical effect of the detected particles on results obtainable by dynamic light scattering; and adjusting the second information using the third information to produce fourth information representing adjusted information on average particle size.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully