Optical endpoint detection system

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United States of America Patent

PATENT NO 9347132
APP PUB NO 20120273005A1
SERIAL NO

13440564

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Abstract

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Methods and apparatus for determining an endpoint of a process chamber cleaning process are provided. In some embodiments, a processing system having an endpoint detection system may include a process chamber having internal surfaces requiring periodic cleaning due to processes performed in the process chamber; and an endpoint detection system that includes a light detector positioned to detect light reflected off of a first internal surface of the process chamber; and a controller coupled to the light detector and configured to determine an endpoint of a cleaning process based upon the detected reflected light.

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Patent Owner(s)

  • APPLIED MATERIALS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hunter, Aaron Muir Santa Cruz, US 90 898
Ishii, Masato Sunnyvale, US 134 1957
Ramachandran, Balasubramanian Santa Clara, US 55 1250

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