Absolute measurement method and apparatus thereof for non-linear error
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United States of America Patent
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May 24, 2016
Grant Date -
Jan 8, 2015
app pub date -
Jan 28, 2014
filing date -
Jul 4, 2013
priority date (Note) -
In Force
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Abstract
The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

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Patent Owner(s)
Patent Owner | Address | |
---|---|---|
NATIONAL INSTITUTE OF METROLOGY | NO 18 NORTH THIRD RING EAST ROAD CHAOYANG DISTRICT BEIJING 100020 BEIJING CITY BEIJING CITY 100020 |
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Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Sun, Ruoduan | Beijing, CN | 1 | 2 |
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