Method of trimming current source using on-chip ADC

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United States of America Patent

PATENT NO 9353017
APP PUB NO 20150362942A1
SERIAL NO

14307472

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Abstract

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A method of trimming a current source in an IC includes deriving a reference voltage from an external supply, and developing a measurement voltage across an external reference resistance receiving the current to be trimmed. An on-chip ADC is used to provide corresponding digital reference and digital measurement signals. A digital comparator compares the digital signals and provides a digital trim signal, which is used to adjust the current to be trimmed until the digital measurement signal is equal to the digital reference signal within an acceptable tolerance. Gain and offset errors in the ADC cancel and do not affect the calibration of the trim operation.

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Patent Owner(s)

Patent OwnerAddress
NXP USA INC6501 W WILLIAM CANNON DRIVE AUSTIN TX 78735

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Krishna, Siddhartha Gopal New Delhi, IN 8 28
Varma, Vikram Noida, IN 10 92

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