Method, apparatus, and system for measurement of noise statistics and bit error ratio estimation

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United States of America Patent

PATENT NO 9374202
APP PUB NO 20140281763A1
SERIAL NO

13842320

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Abstract

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A sample voltage is received from a device at a first slicer element and a second slicer element. A decision by the first slicer element based on the sample voltage is identified and compared with a decision of the second slicer element based on the sample voltage. The decision of the second slicer element is to be generated from a comparison of the sample voltage with a reference voltage for the second slicer element. Comparing the decisions can be the basis of a soft error ratio determined for a device.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ellis, David G Tualatin, US 27 449
Gazinski, Ophir Ramat Yishai, IL 1 4
Mezer, Amir Haifa, IL 24 254
Peters, Stephen J Aloha, US 4 51
Ran, Adee O Maayan Baruch, IL 33 320
Ravi, Sanjay R Hillsboro, US 2 7
Shuey, Jeffrey M Irmo, US 2 10

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