Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities
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United States of America Patent
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Jul 5, 2016
Grant Date -
Nov 5, 2015
app pub date -
Jul 13, 2015
filing date -
Oct 18, 2012
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Abstract
A method and system for three dimensional crystallographic grain orientation mapping illuminates a polycrystalline sample with a broadband x-ray beam derived from a laboratory x-ray source, detects, on one or more x-ray detectors, diffracted beams from the sample, and processes data from said diffracted beams with the sample in different rotation positions to generate three dimensional reconstructions of grain orientation, position, and/or 3-D volume. A specific, cone beam, geometry leverages the fact that for a point x-ray source with a divergent beam on reflection of an extended crystal grain diffracts x-rays such that they are focused in the diffraction plane direction.
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