Critical capacitor built in test

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United States of America Patent

PATENT NO 9383400
APP PUB NO 20140320155A1
SERIAL NO

14366575

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Abstract

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An electronic circuit and method for carrying out built in test of a capacitor connected to, and arranged to suppress noise at, an input of an electrical circuit is disclosed. The electronic circuit causes current pulses at the input, and monitors the voltage at the input by comparing the voltage at the input with high and/or low reference voltages, outputting a fault signal if the voltage at the input is greater than a high reference voltage or lower than a low reference voltage.

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Patent Owner(s)

Patent OwnerAddress
SILICON SENSING SYSTEMS LIMITEDSOUTHWAY PLYMOUTH DEVON PL6 6DE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Durston, Michael Plymouth, GB 12 36
Sitch, Douglas Robert Plymouth, GB 5 12

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