Analysis device, analysis method, optical element and electronic apparatus for analysis device and analysis method, and method of designing optical element

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United States of America Patent

PATENT NO 9389178
APP PUB NO 20140253920A1
SERIAL NO

14194903

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Abstract

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An analysis device includes an optical element which includes a metal layer, a light transmitting layer on the metal layer, and a plurality of metal particles on the light transmitting layer arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction, P1

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Patent Owner(s)

  • SEIKO EPSON CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sugimoto, Mamoru Chino, JP 67 488

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